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Electronica Azi SMT – December 2015
Boundary Scan Techniques for Test Coverage Improvement
When discussing the JTAG protocol, most engineers immediately think of In-System Programming procedures. Indeed, there are numerous Microcontrollers (or FPGAs, CPLDs) that employ this protocol when it comes to their programming and such applications are widely spread throughout the industry. The fact is that this protocol can be also used for various other purposes which can strengthen your testing techniques. Boundary Scan Testing (sometimes called JTAG testing) methods can significantly help you improve the Test Coverage. This paper presents dedicated hardware and software tools which are focused on performing Boundary Scan Testing (BST). Furthermore, some basic principles of the 1149.1 standard are described.
SMT007 – June 2015
Test Match — Partnering Specialist Boundary-Scan with ICT
Specialist boundary-scan is an ideal companion to ICT and flying probe testing. Users can benefit from better fault coverage, better test re-use, faster test development and fuller diagnostics. Popular ICT platforms have the necessary expansion capability built in, and specialty boundary-scan can be integrated successfully with flying probe equipment.
